Image sensor including temperature sensor and electronic shutter function

ABSTRACT

An image capture device includes an image sensor, a reading component, a timing generator, and a voltage regulator. The image sensor includes a temperature sensor configured to measure temperature measurements of the image sensor. The reading component is configured to read the temperature measurements from the temperature sensor. The timing generator is configured to apply an electronic shutter pulse to the image sensor. The voltage regulator is coupled between the temperature sensor and the reading component for regulating increased voltage at the reading component resulting from the electronic shutter pulse.

This application is a division of U.S. patent application Ser. No.14/021,667, filed Sep. 9, 2013, entitled “Image Sensor IncludingTemperature Sensor and Electronic Shutter Functions,” invented by theinventors hereof and assigned to the assignee hereof.

BACKGROUND OF THE INVENTION 1. Field of the Invention

The present invention includes an image sensor including a temperaturesensor and operable to use the temperature sensor compatibly with anelectronic shutter pulse. The present invention also includes a methodof compatibly using the temperature sensor and the electronic shutterpulse.

2. Description of the Related Art

Performance of an integrated circuit, such as an image sensor, can bedependent on the temperature of the integrated circuit. As one example,dark current inside an image sensor is highly temperature dependent. Thedark current increases with an increase of temperature of the integratedcircuit and higher dark current degrades the performance of the imagesensor. Higher dark current impacts the dynamic range and the darkreference level of the image sensor and can cause various defects incaptured images. The image sensor is also susceptible to permanentdamage if the temperature becomes too high.

The image sensor can include a temperature sensor, such as a temperaturediode, for measuring the temperature of the image sensor. Themeasurements from the temperature diode can be read by a readingcomponent, such as an analog-to-digital converter, and a processorconnected to the reading component can control a thermoelectric coolercoupled to the image sensor based on the temperature measurements.

When voltage is applied across the temperature diode to forward bias thediode, current flows through the diode. The relationship between thevoltage across the diode and the current through the diode istemperature dependent. In other words, at the same voltage, the currentincreases with the temperature. Likewise, at the same current, theabsolute value of the voltage decreases with the temperature. When therelationship between voltage across the diode and the current throughthe diode is calibrated for the image sensor, the temperature of theimage sensor can be determined by reading one of these parameters whilesetting the other parameter at a constant.

One advantage in some types of image sensors, e.g., an interlinetransfer image sensor, is the ability to apply a global reset to animage sensing region of the image sensor by applying a high voltagepulse to the substrate of the image sensor to drain away all charge inphotodiodes of the image sensing region prior to image capture. The highvoltage pulse is referred to as an electronic shutter pulse. However,when voltage associated with the electronic shutter pulse issufficiently high, e.g., above 17V, substrate punch-through occurs,which increases the voltage across the temperature diode. Since thetemperature measurement from the temperature diode is dependant on therelationship between the voltage across the diode and the currentthrough the diode, the voltage increase across the temperature diode dueto the substrate punch-through from the electronic shutter pulsedisadvantageously alters the temperature measurement from thetemperature diode.

In other words, the electronic shutter pulse causes substratepunch-through at the diode and corrupts readings from the temperaturediode, thus making the temperature diode and the electronic shutterpulse incompatible features. The voltage increase across the temperaturediode from the electronic shutter pulse can also cause damage to thereading component. There remains an opportunity to design a circuit thatcan determine the temperature of the image sensor without corruptionfrom the application of the electronic shutter pulse.

SUMMARY OF THE INVENTION AND ADVANTAGES

One embodiment of the invention includes an image capture devicecomprising an image sensor including a temperature sensor for measuringtemperature measurements of the image sensor. A timing generator iscoupled to the image sensor for applying an electronic shutter pulse tothe image sensor. A reading component is coupled to the temperaturesensor and reads the temperature measurements from the temperaturesensor only in the absence of the electronic shutter pulse. A processoris coupled to the reading component and the timing generator and isconfigured to instruct the timing generator to apply the electronicshutter pulse to the image sensor and to disable the reading of thetemperature measurements by the reading component during the applicationof the electronic shutter pulse.

Another embodiment of the invention includes a method of determining atemperature of an image sensor. The method comprises measuring thetemperature of the image sensor with a temperature sensor; readingtemperature measurements from the temperature sensor; applying anelectronic shutter pulse to the image sensor; and disabling the readingof the temperature measurements during the electronic shutter pulse toavoid reading a temperature measurement that is altered by theelectronic shutter pulse.

Another embodiment of the invention includes an image capture devicecomprising an image sensor including a temperature sensor for measuringtemperature measurements of the image sensor. A reading component iscoupled to the temperature sensor for reading the temperaturemeasurements from the image sensor. A timing generator is coupled to theimage sensor for applying an electronic shutter pulse to the imagesensor. A voltage regulator is between the temperature sensor and thereading component for regulating increased voltage at the readingcomponent resulting from the electronic shutter pulse.

Another embodiment of the invention includes a method of determining atemperature of an image sensor. The method comprises measuring thetemperature of the image sensor with a temperature sensor; readingtemperature measurements from the temperature sensor with a readingcomponent; applying an electronic shutter pulse to the image sensor; andregulating voltage between the temperature sensor and the readingcomponent resulting from the electronic shutter pulse to prevent damageto the reading component.

By disabling the reading of temperature measurements by the readingcomponent during application of the electronic shutter pulse, theprocessor ensures that erroneous readings corrupted by substratepunch-through from the electronic shutter pulse are not read and actedupon by the image capture device. In other words, this advantageouslyensures that the image capture device does not erroneously operate basedon the erroneous temperature measurements resulting from substratepunch-through from the electronic shutter pulse.

The voltage regulator advantageously regulates increased voltageresulting from electronic shutter pulse. Specifically, the voltageregulator regulates voltage at the reading component at a levelsufficiently low to prevent damage to the reading component. The voltageregulator also prevents reading of an erroneous temperature measurementresulting from the substrate punch-through from the electronic shutterpulse.

BRIEF DESCRIPTION OF THE DRAWINGS

Other advantages of the present invention will be readily appreciated,as the same becomes better understood by reference to the followingdetailed description when considered in connection with the accompanyingdrawings wherein:

FIG. 1 is a block diagram of an image capturing device including animage sensor;

FIG. 2 is a schematic cross-sectional view of one embodiment of theimage sensor including a temperature diode;

FIG. 3 is a graph showing the correlation between voltage across thetemperature diode and current through the temperature diode at threedifferent temperatures of the image sensor;

FIG. 4 is a graph showing the effect on voltage through the diodeassociated with substrate punch-through resulting from the applicationof an electronic shutter pulse to the image sensor;

FIGS. 5A and 5B are graphs comparing voltage across the temperaturediode, shown in FIG. 5A, in the absence of an electronic shutter pulse,as shown in FIG. 5B;

FIGS. 6A and 6B are graphs comparing voltage across the temperaturediode, shown in FIG. 6A, during the application of an electronic shutterpulse to the image sensor, as shown in FIG. 6B;

FIG. 7 is a block diagram of a first embodiment of a circuit of theimage capturing device;

FIG. 8 is a block diagram of a second embodiment of a circuit of theimage capturing device;

FIG. 9A is a schematic cross-sectional view of the image sensor of FIG.2 when V_(SUB) is set to 0V and in the absence of substratepunch-through;

FIG. 9B is a schematic cross-sectional view of the image sensor of FIG.2 illustrating a type of substrate punch-through when V_(SUB) is set to30V;

FIGS. 10A and 10B are schematic cross-sectional views of embodiments ofan image sensor including a temperature sensor when V_(SUB) is set to 0Vand 30V;

FIG. 11 is a graph of the voltage across the temperature sensor duringthe application of an electronic shutter pulse in the image sensor ofFIG. 10; and

FIGS. 12A to 12N are schematic cross-sectional views showingmanufacturing steps of the image sensor of FIGS. 10A and 10B.

DETAILED DESCRIPTION OF THE INVENTION

With reference to the Figures, wherein like numerals indicate like partsthroughout the several views, a simplified block diagram of an imagecapture device 10 including an integrated circuit, e.g., an image sensor12, is shown in FIG. 1. The image capture device 10 is implemented as adigital camera 11 in FIG. 1. Those skilled in the art will recognizethat a digital camera 11 is only one example of the image capture device10. Alternatively, the image capture device 10 can be, for example, acell phone camera, scanner, copier, digital video camcorder, etc.

In the digital camera 11, light from a subject scene is input to animaging stage 14. The imaging stage 14 can include conventional elements(not shown) such as a lens, a neutral density filter, an iris and ashutter. Light is focused by the imaging stage 14 to form an image onthe image sensor 12. The image sensor 12 captures one or more images byconverting the incident light into electrical signals. By way of exampleonly, the image sensor 12 can be a charge-coupled device (CCD) imagesensor or a complementary metal-oxide semiconductor (CMOS) image sensor.

With continued reference to FIG. 1, a timing generator 16 is coupled tothe image sensor 12 and transmits various control and timing signals toimage sensor 12. The control and timing signals include the timingsignals in the timing patterns needed to read out charge from imagesensor 12. The timing generator 16 shown in FIG. 1 can represent one ormore timing generators 16 that produce various control and timingsignals for image sensor 12. The one or more timing generators 16 can beintegrated with image sensor 12 or implemented separately from imagesensor 12.

The digital camera 11 includes a processor 18 and memory 20, andtypically includes a display 22, and one or more additional input/output(I/O) elements 24. Although shown as separate elements in the embodimentof FIG. 1, the imaging stage 14 may be integrated with image sensor 12,and possibly one or more additional elements of the digital camera 11,to form a compact camera module.

The processor 18 may be implemented, for example, as a microprocessor, acentral processing unit (CPU), an application-specific integratedcircuit (ASIC), a digital signal processor (DSP), or other processingdevice, or combinations of multiple such devices. Various elements ofthe imaging stage 14 and the image sensor 12 may be controlled by timingsignals or other signals supplied from the processor 18 and/or thetiming generator 16. The processor 18 is coupled to the timing generator16 and, based on the operating mode of the digital camera 11, theprocessor 18 is configured to control the timing generator 16. Theprocessor 18 instructs the timing generator 16 to produce variousvertical CCD or horizontal CCD clocking signals depending on theoperating mode of the digital camera 11.

The memory 20 may be configured as any type of memory, such as, forexample, random access memory (RAM), read-only memory (ROM), Flashmemory, disk-based memory, removable memory, or other types of storageelements, in any combination. A given image captured by the image sensor12 may be stored by the processor 18 in the memory 20 and presented onthe display 22. The display 22 is typically an active matrix colorliquid crystal display (LCD), although other types of displays may beused. The additional I/O elements 24 may include, for example, variouson-screen controls, buttons or other user interfaces, networkinterfaces, or memory card interfaces. A voltage driver (not shown) mayalso be included, particularly when a large voltage clock is alsoincluded and drives the image sensor 12. Other components, such as apower supply (not shown) may also be included.

It is to be appreciated that the digital camera 11 shown in FIG. 1 maycomprise additional or alternative elements of a type known to thoseskilled in the art. Elements not specifically shown or described hereinmay be selected from those known in the art. Also, certain aspects ofthe embodiments described herein may be implemented at least in part inthe form of software executed by one or more processing elements of thedigital camera 11. Such software can be implemented in a straightforwardmanner given the teachings provided herein, as will be appreciated bythose skilled in the art.

FIG. 2 shows a cross-section of one embodiment of the image sensor 12including a temperature sensor 26 for measuring temperature measurementsof the image sensor 12. Specifically, the temperature sensor 26 is atemperature diode 27 implemented as a PN junction diode. The temperaturediode 27 is connected to a bond pad 28 and to a reference voltage, whichis ground 30 in FIG. 2.

With continued reference to FIG. 2, the image sensor 12 includes ann-type substrate 32. Within the substrate 32 is a lightly doped p-typelayer 33. A heavily doped p-type well 34 and an n-type region 40 aredisposed in the lightly doped p-type layer 33. A p-plus implant region37 and an n-plus implant region 36 are disposed in the heavily dopedp-type well 34. The p-plus implant region 37 is connected to ground 30.N-type region 40 is an image sensing region (also referred to herein asimage sensing region 40), which forms and includes active pixels (notshown) and transfer registers (not shown).

The temperature diode 27 is disposed in the p-type layer 33. Thetemperature diode 27 is disposed between the n-plus implant region 36and the p-plus implant region 37. The anode of the temperature diode 27is connected to the p-plus implant region 37. The cathode of thetemperature diode 27 is connected to the n-plus implant region 36. Thecathode of the temperature diode 27 is connected to the bond pad 28through the n-plus implant region 36. The anode of the temperature diode27 is connected to ground 30 through the p-plus implant region 37. Then-type substrate 32 is connected to bond pad 42 through the n-plusimplant region 44. As set forth further below, a reading component 38,e.g., an analog-to-digital converter (ADC) is connected to the bond pad28 and, as such, the reading component 38 is connected to the cathode ofthe temperature diode 27. The image sensor 12 may also include outputamplifiers (not shown) that output signal. The temperature diode 27 maybe separated from the n-type region 40 by a p-type channel stop region48 that acts to prevent interference between the temperature diode 27and other components within the n-type region 40. Other channel stopregions 46 may be included in other areas of the image sensor 12.Channel stop regions 46 may be p-type regions.

When a negative voltage is applied at the bond pad 28, the temperaturediode 27 is forward-biased and current flows through the temperaturediode 27 from ground 30 to the bond pad 28. The relationship betweenvoltage V_(d) across the temperature diode 27 and current I_(d) throughthe temperature diode 27 is temperature dependent. In other words, atthe same voltage, the current increases with the temperature. Likewise,at the same current, the absolute value of the voltage decreases withthe temperature. For example, FIG. 3 shows the voltage V_(d) and thecurrent I_(d) of the temperature diode 27 for three differenttemperatures, namely 30° C., 60° C., and 90° C. When the relationshipbetween V_(d) and I_(d) is calibrated for the image sensor 12, thetemperature of the image sensor 12 is determined by reading oneparameter while setting the other parameter at a constant. As set forthfurther below, temperature measurements from the temperature diode 27are read with the reading component 38, e.g., an analog-to-digitalconverter (ADC) as shown in FIGS. 7 and 8.

One method that can be used to calculate temperature is to comparedifferent voltages at a constant current. The voltage values atdifferent temperatures are obtained along a vertical line in FIG. 3 whenthe current of the power supply is constant, e.g., at −0.002 A. Thevoltage values corresponding to temperatures can be included in alook-up table saved in the memory 20 of the image capture device 10. Thetemperature of the image sensor 12 can be obtained by matching the diodevoltage V_(d) with one of the diode voltages stored in the lookup table.If a voltage falls in between two voltage values, a linear interpolationcan be performed to get the temperature value.

Another method that can be used to calculate temperature is to comparedifferent current values obtained at a constant voltage. The currentvalues at different temperatures are obtained along the vertical linewhen the voltage is constant, e.g., at −0.7V. The current valuescorresponding to temperatures can be included in a look-up table savedin the memory 20 of the image capture device 10. The temperature of theimage sensor 12 can be obtained by matching the diode current I_(d) withone of the diode currents stored in the lookup table. If a current fallsin between two current values in the look-up table, a linearinterpolation can be performed to get the temperature value.

The image capture device 10 includes an electronic shutter feature.Prior to capturing an image, a global reset is applied to the imagesensing region by pulsing the substrate to a high voltage to drain awayall charge in photodiodes (not shown) of the image sensing region 40.The pulse is referred to in industry as an electronic shutter pulse.Typically, the electronic shutter pulse is between 20V and 40V. Thetiming generator 16 applies the electronic shutter pulse to the imagesensor 12. Specifically, the processor 18 is connected to and controlsthe timing generator 16 and instructs the timing generator 16 to applythe electronic shutter pulse to the image sensor 12. The image sensor 12can be, for example, an interline transfer image sensor 12 that uses anelectronic shutter pulse.

The electronic shutter pulse is applied to the substrate 32 through abond pad 42 connected to an n-plus implant region 44. Specifically withreference to FIGS. 4-6B, a voltage V_(SUB) is applied at the bond pad42. The electronic shutter pulse is applied by raising voltage V_(SUB)to between 20V and 40V. With reference to FIG. 4, when V_(SUB) is setlow, i.e., during a non-pulse state, the temperature diode 27 functionsnormal. For example, FIG. 4 shows one example when V_(SUB) is below 17V,the voltage V_(d) of the temperature diode 27 remains at about −0.7V(see point A). However, when the V_(SUB) increases above 17V, thevoltage V_(d) of the diode starts to be pulled up by the V_(SUB) voltagedue to the substrate punch-through. At point B, i.e., when V_(SUB) is30V, the voltage V_(d) of the temperature diode 27 reaches approximately8V, which disrupts the normal V-I characteristics of the temperaturediode 27 shown in FIG. 3. In other words, the V-I relationship of thetemperature diode 27 is only valid when V_(SUB) is below 17V.

FIGS. 5A and 5B show V_(d) and V_(SUB) versus time when V_(SUB) ismaintained at 10V and FIGS. 6A and 6B show V_(d) and V_(SUB) versus timewhen V_(SUB) is pulsed to 30V to apply the electronic shutter pulse tothe substrate 32. With reference to FIGS. 5A and 5B, when V_(SUB) is setat a constant 10V, the voltage V_(d) of the temperature diode 27 is atits normal range, i.e., about −0.7V. However, as shown in FIGS. 6A and6B, when V_(SUB) is pulsed to 30V between times t1 and t2 and betweentimes t3 and t4, the voltage V_(d) of the temperature diode 27 is pulledup to 8V. Since the voltage V_(d) of the temperature diode 27 iscorrupted due to the substrate punch-through, readings from thetemperature diode 27 between t1 and t2 and between t3 and t4 are notvalid to correlate to the temperature of the image sensor 12. Forexample, when a temperature control-loop circuit inside the digitalcamera 11 monitors temperature, an erroneous temperature reading willoccur during the activation of the electronic shutter pulse inside theimage sensor 12.

A first embodiment of a circuit 66 of the image capture device 10 isshown in FIG. 7. With reference to FIG. 7, the reading component 38 iscoupled to the temperature sensor 26. As set forth above, the readingcomponent 38 reads temperature measurements from the temperature sensor26.

In the embodiment shown in FIG. 7, the reading component 38 reads thetemperature measurements from the temperature sensor 26 only in theabsence of the electronic shutter pulse. Specifically, the processor 18is configured to instruct the timing generator 16 to apply theelectronic shutter pulse to the image sensor 12 and to disable thereading of the temperature measurements by the reading component 38during the application of the electronic shutter pulse. The processor 18simultaneously disables the reading of the temperature measurement bythe reading component 38 and instructs the timing generator 16 to supplythe electronic shutter pulse. The processor 18 subsequently enables thereading of the temperature measurement by the reading component 38 afterthe electronic shutter pulse is completed.

As shown in FIG. 7, the circuit 66 includes a cooler 68 for cooling theimage sensor 12 based on the temperature measurements by the temperaturesensor 26. The cooler 68, for example, is a thermoelectric (TE) cooler.

The following is a description of a method of determining thetemperature of the image sensor 12 using the circuit 66 shown in FIG. 7.The method includes measuring the temperature of the image sensor 12with the temperature sensor 26, specifically with the temperature diode27. Specifically, the step of measuring the temperature includesapplying a constant current to the bond pad 28 to forward bias thetemperature diode 27. In the embodiment shown in FIG. 7, the constantcurrent applied to the bond pad 28 is a negative current, typically −10uA. Alternatively, a constant voltage may also be applied to the bondpad 28 to forward bias the temperature diode 27. In the embodiment shownin FIG. 7, the constant voltage applied to the bond pad 28 is a negativevoltage, typically −0.7V.

The method includes reading temperature measurements from thetemperature sensor 26, and specifically, reading the temperaturemeasurements with the reading component 38, e.g., the ADC. The step ofreading includes reading the diode voltage V_(d) with the readingcomponent 38. This step includes comparing the diode voltage V_(d) withknown voltage-temperature values, i.e., in the lookup table as set forthabove. Alternatively, the step of reading includes reading the diodecurrent I_(d) with the reading component 38. This step includescomparing the diode current I_(d) with known current-temperature values,i.e., in the lookup table as set forth above.

The method includes applying the electronic shutter pulse to the imagesensor 12. Specifically, applying the electronic shutter pulse includesapplying increased voltage to the bond pad, e.g., typically between 20Vand 40V. As set forth above, the processor 18 instructs the timinggenerator 16 to apply the electronic shutter pulse to the bond pad 42.

The method includes disabling the reading of the temperaturemeasurements during the electronic shutter pulse to avoid reading atemperature measurement that is altered by the electronic shutter pulse.The application of the electronic shutter pulse and the disablement ofthe reading of the temperature measurements are simultaneous. Bydisabling the reading of the temperature measurement during theelectronic shutter pulse, the processor 18 avoids the erroneous V-Icharacteristic through the temperature diode 27 associated with thesubstrate punch-through from the electronic shutter pulse. Accordingly,errors associated with such erroneous readings are avoided.

After the electronic shutter pulse has been applied, the method includesresuming the reading of the temperature measurements after theelectronic shutter pulse is applied. Specifically, after the electronicshutter pulse is completed, the processor 18 instructs the readingcomponent 38 to resume reading temperature measurements from thetemperature sensor 26.

The method includes instructing the cooler 68 to cool the image sensor12 based on the temperature measurement. The method includes reading alast temperature measurement before the electronic shutter pulse isapplied and instructing the cooler 68 based on the last temperaturemeasurement during the application of the electronic shutter pulse. Themethod includes resuming the reading of the temperature measurementsafter the electronic shutter pulse is applied and providing instructionsto the cooler 68 from the processor 18 based on the new temperaturemeasurements after the reading of the temperature measurements isresumed. In other words, when the electronic shutter pulse is applied,the cooler will use the last temperature measurement until the processor18 instructs the reading component 38 to take the next reading after theelectronic shutter pulse is completed.

A second embodiment of a circuit 146 of the image capture device 10 isshown in FIG. 8. Common numerals are used to identify common elements inFIGS. 7 and 8. The circuit 146 of FIG. 8 includes a voltage regulator 50between the temperature sensor 26 and the reading component 38 forregulating voltage across the temperature sensor 26 from the electronicshutter pulse. A processor 118 is connected to the reading component 38and the timing generator 16. It should be appreciated that the voltageregulator 50 can also be used with the circuit 66 of FIG. 7, i.e., withthe processor 18 configured to instruct the timing generator 16 to applythe electronic shutter pulse to the image sensor 12 and to disable thereading of the temperature measurements by the reading component 38during the application of the electronic shutter pulse, as set forthabove.

The voltage regulator 50 includes a Zener diode 52. The Zener diode 52is connected to ground 54 and is configured to short-circuit to ground54 when voltage associated with the electronic shutter pulse is appliedto the temperature sensor 26, i.e., when the substrate punch-throughoccurs and the voltage across the temperature diode 27 increases. Inother words, the operating parameters of the Zener diode 52 are designedsuch that the Zener diode 52 is off when the voltage across thetemperature diode 27 is normal, i.e., in the absence substratepunch-through associated with the electronic shutter pulse as shown inFIG. 5A, and is designed to turn on when substrate punch-through occursand the voltage across the temperature diode 27 exceeds a predeterminedlevel. The higher voltage from the substrate punch-through turns on theZener diode 52 such that the Zener diode 52 is forward biased andcurrent flows from the temperature diode 27 through the Zener diode 52to ground 54. The Zener diode 52 can be of any type, such assemiconductor, ceramic, etc., that is suitable to turn on in response tohigher voltage across the temperature diode 27 from substratepunch-through.

This short-circuit to ground 54 protects the reading component 38 fromthe high voltage across the temperature diode 27 that results from thesubstrate punch-through. When the Zener diode 52 is turned on, the Zenerdiode 52 regulates the voltage at the reading component 38 to a constantvoltage, e.g., 0.7V. When the electronic shutter pulse is completed, theV-I characteristic through the temperature diode 27 returns to normaland the Zener diode 52 turns off such that the Zener diode 52 againreads the temperature measurements temperature diode 27.

The voltage regulator 50 includes a resistor 56 between the Zener diode52 and the temperature sensor 26. The resistor 56 isolates the Zenerdiode 52 from the temperature sensor 26. In other words, the Zener diode52 and the resistor 56 together form a resistively isolated voltageclamp. During substrate punch-through, this isolation caused by theresistor 56 enables the Zener diode 52 to regulate the voltage at thereading component 38. In other words, the resistor 56 allows the voltageat node N1 to be different than the voltage at node N2 and allows theZener diode 52 to provide a constant voltage at node N1 when the Zenerdiode 52 is on. The parameters of the resistor 56 are chosen based ondesign requirements as known to one skilled in the art. The resistanceof the resistor 56 is chosen to be high enough so as to not appreciablyload the temperature diode 27, and an input bias current from thereading component 38 does not create a significant offset voltage on theresistor 56.

The following is a description of a method of determining thetemperature of an image sensor 12 using the circuit shown in FIG. 8. Themethod of FIG. 8 includes measuring the temperature of the image sensor12 with a temperature sensor 26 and reading temperature measurementsfrom the temperature sensor 26 with a reading component 38, as set forthabove with reference to FIG. 7. The method also includes applying anelectronic shutter pulse to the image sensor 12 as set forth above withreference to FIG. 7.

The method includes regulating voltage between the temperature sensor 26and the reading component 38 from the electronic shutter pulse toprevent damage to the reading component 38. Specifically, regulating thevoltage includes short-circuiting current through the temperature sensor26 associated with the electronic shutter pulse through the Zener diode52 to ground 54.

The method includes increasing voltage at the Zener diode 52 to turn theZener diode 52 on during substrate punch-through, i.e., turning theZener diode 52 on in response to increased voltage across thetemperature diode 27 from substrate punch-through to regulate thevoltage level at the reading component 38. The method also includesreducing the voltage at the Zener diode 52 to turn the Zener diode 52off after completion of the electronic shutter pulse, i.e., turning theZener diode 52 off when the voltage across the temperature diode 27returns to normal in response to completion of the electronic shutterpulse. When the Zener diode 52 is turned off, the method includesresuming measurement of the temperature measurements from thetemperature diode 27 with the reading component 38. Accordingly, themethod protects the reading component 38 from high voltage across thetemperature diode 27 associated from the substrate punch-through fromthe electronic shutter pulse.

Other embodiments of an image sensor 112 is shown in FIGS. 10A and 10B.By way of example, FIG. 9A schematically shows a cross-section of theimage sensor of FIG. 2 when substrate punch-through is not observed andFIG. 9B schematically shows a cross-section of the image sensor of FIG.2 experiencing substrate punch-through, an effect that is reduced oreliminated by the exemplary embodiments of the image sensor, including atemperature sensor, of FIGS. 10A and 10B.

Specifically, FIGS. 9A and 9B show a cross-section of image sensor 12and illustrate a type of substrate punch-through with respect to theimage sensor of FIG. 2. FIG. 9A shows the image sensor 12 when V_(SUB)is set to 0V and FIG. 9B shows the image sensor 12 when V_(SUB) is setto 30V. The p-type well 34 and the lightly doped p-type layer 33 aredisposed between the n-type substrate 32 and the n-plus implant region36. A bipolar transistor forms with an emitter at the region 36, acollector at substrate 32 and a base in between substrate 32 and region36. It follows that a PN junction forms between the emitter and the baseand another PN junction forms between the base and the collector. Asshown in FIG. 9A, depletion boundary line 80 references the depletionboundary between the emitter and the base and depletion boundary line 85references the depletion boundary between the base and the collector.Depletion boundary line 95 references the depletion boundary of n-typeregion 40. Effective base channel length d, marked by arrow 90, is thedistance between the top of depletion boundary (between the emitter andthe base) as referenced by line 80 and the bottom of depletion boundary(between the base and the collector) as referenced by line 85. WhenV_(SUB) is set to 0V, as shown in FIG. 9A, lines 80 and 85 are notshorted together, i.e., d is greater than 0, and the bipolar transistorfunctions in a normal state and substrate punch-through is not observed.The temperature diode (not shown) measures temperature adequately andcorrectly, as shown in FIG. 4 at Point A.

For a PN junction, the depletion depth may be affected by either thevoltage across the junction or the doping profile across the junction,as described in S. M. Sze; “Physics of Semiconductor Devices”; 2^(nd)Ed, 1981; pp. 74-79. In substrate punch-through, the depletion depthincreases if the voltage across either of the PN junctions (between theemitter and the base or between the base and the collector) increases.Since the electronic shutter pulse voltage, i.e., V_(SUB) at a highlevel, is applied at the collector end of the bipolar transistor, thedepletion boundary line 85 is pushed upwards. It follows that theeffective base channel length d narrows. FIG. 9B shows when V_(SUB)reaches a certain value, e.g. 30V, the two depletion boundaries lines 80and 85 meet and short together. No base will effectively exist causingthe emitter and the collector to short together during substratepunch-through. In this type of substrate punch-through, the base channellength d equals zero (d=0). The majority carrier, i.e., electrons, inthe collector region is swept away from the collector to the emitter,causing the substrate punch-through. When d equals 0, the bipolartransistor acts like an ohmic resistor which pulls up the voltage fromabout −0.7V to a more positive value, exhibiting substratepunch-through, for example, as shown in FIG. 4 at Point B. It isunderstood that the location of depletion boundary line 95 may vary fromthe location of line 95 as shown due to the amount and thickness oflayers in the n-type region 40.

As set forth above, higher doping will decrease the depletion depth ofthe base. If the doping density in the base (p type) increases, thedepletion boundary line 80 pushes up and the depletion boundary line 85pushes down. In this case, the effective base channel length d widens.If the doping density in the base is high enough, even when V_(SUB) isset at maximum value of 40V, the effective base channel length d isstill wide enough to prevent substrate punch-through. In embodiments asshown in FIGS. 10A and 10B, an additional p-type implant region 195 isadded to the heavily doped p-type well 34 to aid in reducing orpreventing substrate punch-through. As such, the temperature diodevoltage is minimally disrupted, or not disrupted at all, by theelectronic shutter pulse voltage.

As set forth above, FIG. 10A shows a cross-section of the image sensor112 when V_(SUB) is set to 0V and FIG. 10B shows a cross-section of theimage sensor 112 when V_(SUB) is set to 30V. The image sensor 112includes a substrate having a first conductivity type. The substrate maybe a wafer with an n-type substrate 32. Alternatively, the wafer may beof a p-type substrate. The wafer may be a silicon wafer.

The image sensor 112 also includes a first well in the substrate. Thefirst well has an opposite conductivity type and is doped with oppositeconductivity type dopant at a first dosage at a first implantationenergy. The first well may be a lightly doped p-type layer 33.Alternatively, if the wafer is of the p-type substrate, the first wellmay be a lightly doped n-type layer.

The image sensor 112 also includes a second well in the first well. Thesecond well has the opposite conductivity type and is doped withopposite conductivity type dopant at a second dosage higher than thefirst dosage. The second well may be a heavily doped p-type well 34.Alternatively, if the wafer is of the p-type substrate, the second wellmay be a heavily doped n-type well.

The image sensor 112 may include a third well in the first well andadjacent the second well. The third well has the first conductivity typeand is doped with first conductivity type dopant at the first dosage atthe first implantation energy. The third well may be an n-type region40. Alternatively, if the wafer is of the p-type substrate, the thirdwell may be a p-type region.

The image sensor 112 also includes a first region in the second well.The first region has the opposite conductivity type and is doped withopposite conductivity type dopant at a second implantation energy higherthan the first implantation energy. With continued reference to FIGS.10A and 10B, as compared to FIG. 2, the first region may be anadditional p-type implant region 195 disposed within the heavily dopedp-type well 34 and under the n-plus implant region 36 (described below).In this case, the additional p-type implant region 195 increases the ptype dose concentration between the n-plus implant region 36 and then-type substrate 32. This pushes the depletion boundary, referenced byline 180, upwards and also pushes the depletion boundary, referenced byline 185, downwards. Depletion boundary line 196 references thedepletion boundary surrounding n-type region 40. Therefore, theeffective base channel length d is increased. The increase in theeffective base channel length d acts to reduce or eliminate thesubstrate punch-through described with respect to FIGS. 9A and 9B. FIG.10B shows that even when V_(SUB) is 30V, the effective base length d isstill greater than 0 (zero) and substrate punch-through is not observed.FIG. 11 is a graph of the voltage across the temperature diode duringthe application of the electronic shutter pulse voltage in the imagesensor 112 of FIGS. 10A and 10B. The diode voltage is shown on they-axis and the electronic shutter pulse voltage V_(SUB) is shown on thex-axis. As shown, at −10 uA (constant current), the diode voltage isconstant when V_(SUB) changes from 0V to 40V. There is no voltagepull-up attributable to substrate punch through as shown in FIG. 4. Thesmall up-trend of the diode voltage as a function of V_(SUB) is due to asmall leakage current flowing from the substrate to temperature diode.The up-trend change is so small that it will not impact the temperaturesensor performance. Therefore, the additional p-type implant region 195aids in reducing or altogether eliminating substrate punch-through whenan electronic shutter pulse is applied to the image sensor 112.Alternatively, if the wafer is of the p-type substrate, the first regionmay be an additional n-plus region disposed within a heavily dopedn-type well. It is understood that the location of depletion boundaryline 196 may vary from the location of line 196 as shown due to theamount and thickness of layers in the n-type region 40.

The image sensor 112 also includes a second region in the first region.The second region has the first conductivity type and is doped withfirst conductivity type dopant at a third dosage higher than the seconddosage at the first implantation energy. The second region may be ann-plus implant region 36. Alternatively, if the wafer is of the p-typesubstrate, the second region may be a p-plus implant region.

The image sensor 112 also includes a third region in the second welladjacent the first region. The third region has the oppositeconductivity type and is doped with opposite conductivity type dopant atthe third dosage at the first implantation energy. The third region maybe a p-plus implant region 37. Alternatively, if the wafer is of thep-type substrate, the third region may be an n-plus implant region.

The image sensor 112 may include a fourth region in the substrate andadjacent the first well. The fourth region has the first conductivitytype and is doped with first conductivity type dopant at the thirddosage at the first implantation energy. The fourth region may be ann-plus implant region 44. Alternatively, if the wafer is of the p-typesubstrate, the fourth region may be a p-plus implant region.

The image sensor 112 also includes a temperature sensor for measuringtemperature measurements of the image sensor. The temperature sensor isdisposed between the second region and the third region and is connectedto each of the second region and the third region. The temperaturesensor may be a temperature diode implemented as a PN junction diode.The temperature diode is connected to a bond pad 28 through the n-plusimplant region 36 and is connected to a reference voltage, which isground 30, through the p-plus implant region 37.

FIGS. 12A to 12N show an embodiment of a process of manufacturing theimage sensor 112 of FIGS. 10A and 10B. The image sensor has thesubstrate having the first conductivity type. The substrate may be thewafer with an n-type substrate 32. Alternatively, the wafer may be ofthe p-type substrate. The wafer may be the silicon wafer. The wafer withthe n-type substrate 32 is loaded for further processing. A maskingprocess step defines at least one opening in a resist layer. In FIG.12A, a blanket ion implantation process is performed on the wafer. Inthis process, an opposite conductivity type dopant is doped at the firstdosage at the first implantation energy to form the first well having anopposite conductivity type in the substrate. For example, a p-typedopant is lightly doped into the n-type substrate 32 by the blanket ionimplantation process. If the wafer is of a p-type substrate, an n-typedopant is lightly doped into the p-type substrate. The p-type dopant maybe boron. The blanket ion implantation process typically proceeds at adosage on the order of 1E11 ions/cm² and implantation energy on theorder of 100 keV. As shown in FIG. 12B, the resist layer is stripped bytypical methods and a thermal well drive is conducted to form the firstwell, for example, the lightly doped p-type layer 33. Alternatively, ifthe wafer is of a p-type substrate, a lightly doped n-type layer isformed. The thermal drive typically proceeds for about 10 hours at about1100° C. in a furnace.

As shown in FIG. 12C, another masking step defines at least one openingin another resist layer. Another blanket implantation process isperformed on the wafer. In this process, a first conductivity typedopant is doped at the first dosage at the first implantation energy toform the third well having the first conductivity type in the first welland adjacent to a second well (described below). For example, an n-typedopant is doped into the lightly doped p-type layer 33 by this blanketimplantation process. If the wafer is of a p-type substrate, a p-typedopant is lightly doped into the lightly doped n-type layer. The n-typedopant may be phosphorus. The blanket ion implantation process typicallyproceeds at a dosage on the order of 1E11 ions/cm² and implantationenergy on the order of 100 keV. As shown in FIG. 12D, the resist layeris stripped by typical methods and a thermal well drive is conducted toform the third well, for example, the n-type region 40. Alternatively,if the wafer is of a p-type substrate, a p-type region is formed. Thethermal drive typically proceeds for about 10 hours at about 1100° C. ina furnace.

As shown in FIG. 12E, another masking step defines at least one openingin another resist layer. Another blanket implantation process isperformed on the wafer. In this process, an opposite conductivity typedopant is doped at the second dosage higher than the first dosage toform the second well having the opposite conductivity type in the firstwell. Additionally, this process may proceed at the first implantationenergy. For example, a p-type dopant is heavily doped into the lightlydoped p-type layer 33 by this blanket implantation process. If the waferis of a p-type substrate, an n-type dopant is heavily doped into thelightly doped n-type layer. The p-type dopant may be boron. The blanketion implantation process typically proceeds at a dosage on the order of1E12 ions/cm² and implantation energy on the order of 100 keV. As shownin FIG. 12F, the resist layer is stripped by typical methods and athermal well drive is conducted to form the second well, for example,the heavily doped p-type well 34. Alternatively, if the wafer is of ap-type substrate, a heavily doped n-type well is formed. The thermaldrive typically proceeds for about 5 hours at about 1100° C. in afurnace.

After the well implant and drive is completed, an insulation layer (notshown) is grown on top of the substrate, i.e., wafer. The insulationlayer may be a nitride layer or an oxide/nitride combination layer. Thena masking step (not shown) is performed on the insulation layer todefine a channel stop region 48 and other channel stop regions 46followed by implanting a p-plus impurity into the wafer. The p-plusimpurity may be boron. Thus, the channel stop region 48 may be a p-typeregion. A field oxide is then grown in the channel stop region 48. Anetching step is then performed to remove the insulation layer thatremains after the masking step. FIG. 12G shows channel stop region 48and other channel stop regions 46 in the image sensor 112. Other channelstop regions 46 may also be p-type regions. Alternatively, if the waferis of a p-type substrate, channel stop region 48 may be an n-type regionand channel stop regions 46 may also be n-type regions.

As shown in FIG. 12H, another masking step defines at least one openingin another resist layer. Another blanket implantation process isperformed on the wafer. In this process, an opposite conductivity typedopant is doped at the second implantation energy higher than the firstimplantation energy to form the first region having the oppositeconductivity type in the second well. Additionally, this process mayproceed at the second dosage. For example, a p-type dopant is heavilydoped into the heavily doped p-type well 34 by this blanket implantationprocess. If the wafer is of a p-type substrate, an n-type dopant isheavily doped into the heavily doped n-type well. The p-type dopant maybe boron. The blanket ion implantation process typically proceeds at adosage on the order of 1E12 ions/cm² and implantation energy on theorder of 300 keV. This implantation step may also form other regions inthe image sensor 112, such as a pixel region. Accordingly, by using thedescribed masking and implantation steps of FIG. 12H, both a pixelregion and a temperature sensor region may be formed. This eliminatesthe need for performing yet another masking step and implantation stepto form the temperature sensor region. Thus, processing steps to formthe image sensor 112 are reduced. As shown in FIG. 12I, the resist layeris stripped by typical methods and a thermal well drive is conducted toform the first region, for example, the additional p-type implant region195 within the heavily doped p-type well 34. Alternatively, if the waferis of a p-type substrate, an additional n-type implant region is formed.The additional p-type implant region 195 (or additional n-type implantregion) aids in reducing or eliminating substrate punch through. In oneembodiment, the additional p-type implant region 195 (or additionaln-type implant region) reduces or prevents substrate punch through whenan electronic shutter pulse is applied to the substrate. The boundarydelimiting additional p-type implant region 195 in FIG. 12I is forillustrative purposes to describe the location of the p-type implantregion 195. The additional p-type implant region 195 and the heavilydoped p-type well 34 are both p-type regions. A distinct boundary wouldnot be present between two regions of the same type, such as two p-typeregions or two n-type regions. In this embodiment, a gradient of dosedistribution is formed along the vertical line from the surface of thewafer downward into the wafer.

As shown in FIG. 12J, another masking step defines at least two openingsin another resist layer. Another blanket implantation process isperformed on the wafer. In this process, a first conductivity typedopant is doped at the third dosage higher than the second dosage toform the second region having the first conductivity type in the firstregion and to form the fourth region having the first conductivity typein the substrate and adjacent the first well. Additionally, this processmay proceed at the first implantation energy. For example, an n-plustype dopant is doped into the additional p-type implant region 195 andthe n-type substrate 32 by this implantation process. If the wafer is ofa p-type substrate, a p-plus type dopant is doped into the additionaln-type implant region. The n-type dopant may be arsenic or phosphorus.Preferably, the n-type dopant is arsenic. The blanket ion implantationprocess typically proceeds at a dosage on the order of 1E15 ions/cm² andimplantation energy on the order of 100 keV. As shown in FIG. 12K, theresist layer is stripped by typical methods to form the second region,for example, the n-plus implant region 36 and the fourth region, forexample, the n-plus implant region 44. Alternatively, if the wafer is ofa p-type substrate, a p-plus implant region for the temperature diodeand a p-plus implant region to connect the substrate are formed.

As shown in FIG. 12L, another masking step defines at least one openingin another resist layer. Another blanket implantation process isperformed on the wafer. In this process, an opposite conductivity typedopant is doped at the third dosage to form the third region having theopposite conductivity type in the second well and adjacent the firstregion. Additionally, this process may proceed at the first implantationenergy. For example, a p-plus type dopant is doped into the heavilydoped p-type well 34 by this implantation process. If the wafer is of ap-type substrate, an n-plus type dopant is doped into the heavily dopedn-type well. The p-plus type dopant may be boron. The blanket ionimplantation process typically proceeds at a dosage on the order of 1E15ions/cm² and implantation energy on the order of 100 keV. As shown inFIG. 12M, the resist layer is stripped by typical methods to form thethird region, for example, the p-plus implant region 37. Alternatively,if the wafer is of a p-type substrate, an n-plus implant region isformed.

In one embodiment as described, the implantation process steps carriedout in the process of manufacturing the image sensor 112 of FIGS. 10Aand 10B are not increased compared to implantation process steps carriedout in a process of manufacturing the image sensor 12 of FIG. 2, evenincluding the implantation process step carried out to form theadditional p-type implant region 195 (or additional n-type implantregion for a p-type substrate). In this embodiment, and as shown in FIG.12J, the n-plus implant region 44 and the n-plus implant region 36 areformed during the same implantation process step.

As shown in FIG. 12N, known metallization processes are performed. Forexample, the temperature sensor for measuring temperature of the imagesensor is disposed between the second region and the third region andthe temperature sensor is connected to each of the second region and thethird region. Specifically, the temperature sensor is the temperaturediode implemented as a PN junction diode. The temperature diode 26, 27is disposed in the heavily doped p-type well 34. The temperature diodeis disposed between the p-plus implant region 37 and the n-plus implantregion 36. The metallization processes also connect a metal bus linebetween the cathode of the temperature diode to bond pad 28 through then-plus implant region 36. The bond pad 28 may be for a readingcomponent. The metallization processes also connect a ground bus linebetween the anode of the temperature diode and ground through the p-plusimplant region 37. The metallization processes also connect the n-plusimplant region 44 to bond pad 42. Alternatively, if the wafer is of ap-type substrate, the same metallization processes may be performedexcept that a metal bus line between the anode of the temperature diodeis connected to bond pad 28 through the p-plus implant region and aground bus line between the cathode of the temperature diode 26, 27 andground is connected through the n-plus implant region corresponding toregion 37.

Other steps in the method of manufacturing the image sensor 112 notrelated to forming the temperature diode 26, 27 are not expresslydescribed. Processes are carried out to form other parts of the imagesensor 112, such as photodiodes to collect photons and transfermechanism(s) to transfer photon-generated signals to an output structureto form an image. In one embodiment, the image sensor 112 is acharge-coupled device (CCD image sensor). To manufacture a CCD imagesensor 112, processes are carried out to form photodiodes, verticalclock transfer registers, horizontal clock transfer registers, floatingdiffusions, and output amplifiers. In one embodiment, the image sensor112 is a CMOS device. To manufacture a CMOS device 112, processes arecarried out to form photodiodes, transfer gates, floating diffusions,output amplifiers, row decoders, column decoders, a sample and holdcircuit, and an ADC circuit.

The cathode of the temperature diode 26, 27 is connected to the bond pad28. As described above with respect to FIG. 3, a reading component,e.g., an analog-to-digital converter (ADC) is connected to the bond pad28 and, as such, the reading component is connected to the cathode ofthe temperature diode 26, 27. The image sensor 112 includes an imagesensing region (not shown) including active pixels, transfer registers,and output amplifiers, etc. (not shown).

When a negative voltage is applied at the bond pad 28, the temperaturediode 26, 27 is forward-biased and current flows through the temperaturediode 26, 27 from ground to the bond pad 28. The relationship betweenvoltage V_(d) across the temperature diode 26, 27 and current I_(d)through the temperature diode 26, 27 is temperature dependent. In otherwords, at the same voltage, the current increases with the temperature.Likewise, at the same current, the absolute value of the voltagedecreases with the temperature. When the relationship between V_(d) andI_(d) is calibrated for the image sensor 112, the temperature of theimage sensor 112 is determined by reading one parameter while settingthe other parameter at a constant. Temperature measurements from thetemperature diode 26, 27 are read with the reading component, e.g., ananalog-to-digital converter (ADC).

The invention has been described in an illustrative manner, and it is tobe understood that the terminology which has been used is intended to bein the nature of words of description rather than of limitation. Manymodifications and variations of the present invention are possible inlight of the above teachings, and the invention may be practicedotherwise than as specifically described.

What is claimed is:
 1. An image capture device comprising: an imagesensor including an image sensing region and a temperature sensorconfigured to measure temperature measurements of said image sensor andto output a temperature measurement signal representative of atemperature measured by said temperature sensor, wherein said imagesensing region and said temperature sensor are formed in a semiconductorsubstrate; a reading component configured to receive said temperaturemeasurement signal and to read said temperature measurements from saidtemperature sensor; a timing generator configured to apply an electronicshutter pulse to said image sensor by applying a high voltage pulse tosaid semiconductor substrate; and a voltage regulator coupled betweensaid temperature sensor and said reading component for regulating anincreased voltage of said temperature measurement signal resulting fromthe electronic shutter pulse.
 2. The image capture device as set forthin claim 1, further comprising a processor configured to instruct saidtiming generator to apply the electronic shutter pulse to said imagesensor and to disable the reading of the temperature measurements bysaid reading component during an application of the electronic shutterpulse.
 3. The image capture device as set forth in claim 1, furthercomprising a cooler wherein the cooler is responsive to a temperaturemeasurement from the reading component to cool the image sensor.
 4. Theimage capture device as set forth in claim 3, wherein the cooler is athermoelectric cooler.
 5. The image capture device as set forth in claim3, further comprising a processor coupled to the reading component andthe cooler, wherein the processor instructs the cooler during theelectronic shutter pulse based on a last temperature measurement beforethe electronic shutter pulse.
 6. The image capture device as set forthin claim 5, wherein the processor resumes reading of the temperaturemeasurements after the electronic shutter pulse is applied and instructsthe cooler based on new temperature measurements after the reading ofthe temperature measurements is resumed.
 7. The image capture device asset forth in claim 1, wherein the voltage regulator includes a Zenerdiode.
 8. The image capture device as set forth in claim 7, wherein saidZener diode is connected to ground and is configured to short-circuit toground when voltage from the electronic shutter pulse is applied to saidtemperature sensor.
 9. The image capture device as set forth in claim 7,wherein the voltage regulator includes a resistor between said Zenerdiode and said temperature sensor.
 10. The image capture device as setforth in claim 7, wherein said temperature sensor is a diode.
 11. Theimage capture device as set forth in claim 10, wherein a cathode of saiddiode is connected to said reading component and an anode of said diodeis connected to ground.
 12. The image capture device as set forth inclaim 10, wherein a substrate of the image sensor is an n-type substrateand wherein said diode is disposed in a p-type well and includes ann-plus implant in said p-type well.
 13. A method of determining atemperature of an image sensor, said method comprising: measuring thetemperature of the image sensor with a temperature sensor and providinga temperature measurement signal in response, wherein the temperaturesensor and the image sensor are formed in a semiconductor substrate;reading temperature measurements from the temperature sensor with areading component; applying an electronic shutter pulse to the imagesensor wherein the electronic shutter pulse is a high voltage pulseapplied to the semiconductor substrate; and regulating a voltage of thetemperature measurement signal between the temperature sensor and thereading component resulting from the electronic shutter pulse to preventdamage to the reading component.
 14. The method as set forth in claim13, wherein regulating the voltage includes short-circuiting currentthrough the temperature sensor from the electronic shutter pulse througha Zener diode to ground.
 15. The method as set forth in claim 13,wherein the temperature sensor is a diode and wherein measuring thetemperature further comprises forward biasing the diode and reading avoltage across the diode or a current through the diode.
 16. The methodas set forth in claim 13, further comprising disabling the reading ofthe temperature measurements during the electronic shutter pulse toavoid reading a temperature measurement that is altered by theelectronic shutter pulse.
 17. The method as set forth in claim 13,further comprising cooling the image sensor responsive to a temperaturemeasurement from the reading component.
 18. The method as set forth inclaim 17, wherein the cooling comprises cooling using is athermoelectric cooler.
 19. The method as set forth in claim 18, furthercomprising instructing the thermoelectric cooler during the electronicshutter pulse based on a last temperature measurement before theelectronic shutter pulse.
 20. The method as set forth in claim 19,further comprising resuming reading of the temperature measurementsafter the electronic shutter pulse is applied and instructing thethermoelectric cooler based on new temperature measurements after thereading of the temperature measurements is resumed.